IS61QDPB42M36 Datasheet, PDF (16/28 Pages) Integrated Silicon Solution, Inc – 72 Mb (2M x 36 & 4M x 18) QUADP (Burst of 4) Synchronous SRAMs

72 Mb (2M x 36 & 4M x 18)
Q^QUADP (Burst of 4) Synchronous SRAMs
I³
AC Test Conditions (T_A = 0 to +70° C, V_DD = 1.8V -5%, +5%, V_DDQ = 1.5, 1.8V)
Parameter
Symbol
Conditions
Output driver supply voltage
Input high level
Input Low Level
Input reference voltage
Input rise time
Input fall time
Output timing reference level
Clocks reference level
Output load conditions
V_DDQ
V_IH
V_IL
V_REF
T_R
T_F
1.5, 1.8
V_REF+0.5
V_REF-0.5
0.75, 0.9
0.35
0.35
V_REF
V_REF
1. See AC Test Loading.
2. Parameter tested with RQ = 250Ω and V_DDQ = 1.5V.
Units
V
V
V
V
ns
ns
V
V
Notes
1, 2
AC Test Loading
50 Ω
Q
50 Ω
0.75, 0.9V
Test
Comparator
5pF
0.75, 0.9V
16
Integrated Silicon Solution, Inc.
Rev. 
05/14/09