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JANSR2N7550T1 Datasheet, PDF (3/8 Pages) International Rectifier – RADIATION HARDENED POWER MOSFET THRU-HOLE (Low-Ohmic TO-254AA)
PRraed-IirartaiodniaCtiohnaracteristics
IRHMS597160, JANSR2N7550T1
International Rectifier Radiation Hardened MOSFETs are tested to verify their radiation hardness capabil-
ity. The hardness assurance program at International Rectifier is comprised of two radiation environments.
Every manufacturing lot is tested for total ionizing dose (per notes 5 and 6) using the TO-3 package. Both
pre- and post-irradiation performance are tested and specified using the same drive circuitry and test
conditions in order to provide a direct comparison.
Table 1. Electrical Characteristics @ Tj = 25°C, Post Total Dose Irradiation ÄÅ
Parameter
100K Rads(Si)1 300KRads(Si)2 Units
Min Max Min Max
Test Conditions
BVDSS Drain-to-Source Breakdown Voltage -100 — -100
—
V
VGS(th) Gate Threshold Voltage
-2.0 -4.0 -2.0 -5.0
IGSS
IGSS
Gate-to-Source Leakage Forward — -100 — -100 nA
Gate-to-Source Leakage Reverse — 100 — 100
IDSS
Zero Gate Voltage Drain Current
RDS(on) Static Drain-to-Source Ã
— -10
— -10 µA
— 0.05 — 0.05 Ω
On-State Resistance (TO-3)
VSD
Diode Forward Voltage Ã
— -5.0
— -5.0
V
VGS = 0V, ID = -1.0mA
VGS = VDS, ID = -1.0mA
VGS =-20V
VGS = 20 V
VDS = -80V, VGS =0V
VGS = -12V, ID =-28.5A
VGS = 0V, IS = -45A
1. Part number IRHMS597160 (JANSR2N7550T1)
2. Part number IRHMS593160 (JANSF2N7550T1)
International Rectifier radiation hardened MOSFETs have been characterized in heavy ion environment for
Single Event Effects (SEE). Single Event Effects characterization is illustrated in Fig. a and Table 2.
Table 2. Single Event Effect Safe Operating Area
Ion
LET
(MeV/(mg/cm2))
Br
37.9
I
59.7
Au
82.3
Energy
(MeV)
252.6
314
350
Range
VDS (V)
(µm) @VGS=0V @VGS=5V @VGS=10V @VGS=15V @VGS=17.5V @VGS=20V
33.1
-100
-100
-100
-100
-100
-100
30.5 -100
-100
-100
-100
-75
-25
28.4 -100
-100
-100
-30
—
—
-120
-100
-80
Br
-60
I
-40
Au
-20
0
0
5
10
15
20
VGS
Fig a. Single Event Effect, Safe Operating Area
For footnotes refer to the last page
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