HCTS164MS_02 Datasheet, PDF (6/8 Pages) Intersil Corporation – Radiation Hardened 8-Bit Serial-In/Parallel-Out Shift Register

Specifications HCTS164MS
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ±0.5V VCC = 6V ±0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
3 - 6, 10 - 13
1, 2, 7 - 9
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3 - 6, 10 - 13
7
-
1, 2, 8, 9, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
7
3 - 6, 10 - 13
9, 14
8
1, 2
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ±5% for static burn-in.
2. Each pin except VCC and GND will have a resistor of 1KΩ ±5% for dynamic burn-in.
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ±0.5V
3 - 6, 10 - 13
7
1, 2, 8, 9, 14
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ±5% for Irradiation Testing.
Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures.
AC Timing Diagrams and Load Circuit
VIH
VIL
VOH
VOL
VS
INPUT
TPLH
VS
TPHL
OUTPUT
VOH
VOL
TTLH
20%
80% 80%
OUTPUT
TTHL
20%
AC VOLTAGE LEVELS
PARAMETER
HCTS
VCC
4.50
VIH
3.0
VS
1.3
VIL
0
GND
0
UNITS
V
V
V
V
V
DUT
CL
CL = 50pF
RL = 500Ω
TEST
POINT
RL
Spec Number 518613
6