HCTS164MS_02 Datasheet, PDF (5/8 Pages) Intersil Corporation – Radiation Hardened 8-Bit Serial-In/Parallel-Out Shift Register

Specifications HCTS164MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
CP to Qn
CP to Qn
MR to Qn
SYMBOL
(NOTES 1, 2)
CONDITIONS
TPLH VCC = 4.5V
TPHL VCC = 4.5V
TPHL VCC = 4.5V
TEMP
+25^oC
+25^oC
+25^oC
200K RAD
LIMITS
MIN MAX
2
33
2
40
2
42
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests VO ≥4.0V is recognized as a logic “1”, and VO ≤0.5V is recognized as a logic “0”.
UNITS
ns
ns
ns
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25^oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12µA
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
Interim Test 1 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
Interim Test 2 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
PDA
100% /5004
1, 7, 9, Deltas
Interim Test 3 (Postburn-In)
100% /5004
1, 7, 9
ICC, IOL/H
PDA
100% /5004
1, 7, 9, Deltas
Final Test
100% /5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate Group A Testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
TEST
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN Test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
Spec Number 518613
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