ISL71840SEH Datasheet, PDF (22/27 Pages) Intersil Corporation – Radiation Hardened 30V 16-Channel Analog

ISL71840SEH
Post Low Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± = ±12V, V_CM = 0,V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
12
10
8
BIASED
6
4
2
0
GROUNDED
-2
-4
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 71. r_DS(ON) SHIFT (V_IN = +5V) vs LDR RADIATION
8
6
GROUNDED
4
2
BIASED
0
-2
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 72. r_DS(ON) SHIFT (V_IN = -5V) vs LDR RADIATION
2
0
-2
-4
GROUNDED
-6
-8
BIASED
-10
-12
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 73. r_DS(ON) SHIFT (V_IN = V^-) vs LDR RADIATION
350
300
BIASED
250
200
GROUNDED
150
100
50
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 74. t_ADD SHIFT (LOW TO HIGH) vs LDR RADIATION
20
15
10
BIASED
5
0
-5
-10
GROUNDED
-15
-20
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 75. t_ADD SHIFT (HIGH TO LOW) vs LDR RADIATION
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16
14
GROUNDED
12
10
8
6
BIASED
4
2
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 76. t_BBM SHIFT vs LDR RADIATION
FN8734.3
June 9, 2016