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ISL71840SEH Datasheet, PDF (21/27 Pages) Intersil Corporation – Radiation Hardened 30V 16-Channel Analog
ISL71840SEH
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, VCM = 0, VO = 0V, TA = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
20
15
BIASED
10
5
300
BIASED
250
200
GROUNDED
150
0
100
GROUNDED
-5
50
-100
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 65. tENABLE SHIFT vs LDR RADIATION
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 66. tDISABLE SHIFT vs LDR RADIATION
Post Low Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± = ±12V, VCM = 0,VO = 0V, TA = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
1.2
0
1.0
GROUNDED
0.8
0.6
BIASED
0.4
0.2
-0.2
-0.4
-0.6
-0.8
GROUNDED
-1.0
-1.2
BIASED
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 67. ICC SUPPLY CURRENT SHIFT vs LDR RADIATION
-1.40
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 68. IEE SUPPLY CURRENT SHIFT vs LDR RADIATION
2.5
2.0
GROUNDED
1.5
1.0
BIASED
0.5
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 69. IREF SUPPLY CURRENT SHIFT vs LDR RADIATION
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35
30
25
BIASED
20
15
10
5
0
GROUNDED
-50
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 70. rDS(ON) SHIFT (VIN = V+) vs LDR RADIATION
FN8734.3
June 9, 2016