ISL71840SEH Datasheet, PDF (19/27 Pages) Intersil Corporation – Radiation Hardened 30V 16-Channel Analog

ISL71840SEH
Post High Dose Rate Radiation Characteristics (V± = ±12V) Unless otherwise
specified, V± ₌ ±12V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a high dose rate of 50 to 300rad(Si)/s.
This data is intended to show typical parameter shifts due to high dose rate radiation. These are not limits nor are they guaranteed. (Continued)
50
45
40
BIASED
35
30
25
20
15
GROUNDED
10
5
00
20 40 60 80 100 120 140 160
HIGH DOSE RATE RADIATION (krad(Si))
FIGURE 53. t_ENABLE SHIFT vs HDR RADIATION
200
180 BIASED
160
140
GROUNDED
120
100
80
60
40
20
00
20 40 60 80 100 120 140 160
HIGH DOSE RATE RADIATION (krad(Si))
FIGURE 54. t_DISABLE SHIFT vs HDR RADIATION
Post Low Dose Rate Radiation Characteristics (V± = ±15V) Unless otherwise
specified, V± = ±15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
1.2
0
1.0
GROUNDED
0.8
0.6
0.4
0.2
BIASED
-0.2
-0.4
-0.6
-0.8
-1.0 ^GROUNDED
-1.2
BIASED
0
0
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
-1.4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 55. I_CC SUPPLY CURRENT SHIFT vs LDR RADIATION
FIGURE 56. I_EE SUPPLY CURRENT SHIFT vs LDR RADIATION
2.5
GROUNDED
2.0
1.5
BIASED
1.0
0.5
00
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 57. I_REF SUPPLY CURRENT SHIFT vs LDR RADIATION
Submit Document Feedback ₁₉
10
8
BIASED
6
4
2
0
GROUNDED
-2
-4 ₀
10
20
30
40
50
60
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 58. r_DS(ON) SHIFT (V_IN = +5V) vs LDR RADIATION
FN8734.3
June 9, 2016