ISL70444SEH Datasheet, PDF (18/23 Pages) Intersil Corporation – 19MHz Rad Hard 40V Quad Rail-to-Rail Input-Output, Low-Power Operational Amplifiers

ISL70444SEH
Post Low Dose Rate Radiation Characteristics Unless otherwise specified, V_S ± 18V, V_CM = 0,
V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This data is intended to
show typical parameter shifts due to high dose rate radiation. These are not limits nor are they guaranteed.
30
20
10
BIASED
Vs = ±18V
30
20
GROUNDED
10
Vs = ±18V
0
0
-10 _GROUNDED
-20
-10
BIASED
-20
-300 _{10 20 30 40 50 60 70 80 90 100}
krad (Si)
FIGURE 55. V_OS SHIFT vs LOW DOSE RATE RADIATION
-300 _{10 20 30 40 50 60 70 80 90 100}
krad (Si)
FIGURE 56. I_BIAS SHIFT vs LOW DOSE RATE RADIATION
6
4
BIASED
2
Vs = ±18V
0
-2 GROUNDED
-4
-6
0 10 20 30 40 50 60 70 80 90 100
krad (Si)
FIGURE 57. I_OS SHIFT vs LOW DOSE RATE RADIATION
0.8
0.6
Vs = ±18V
0.4
0.2 GROUNDED
0
-0.2
-0.4
BIASED
-0.6
-0.8
0
10 20 30 40 50 60 70 80 90 100
krad (Si)
FIGURE 58. I⁺ SHIFT vs LOW DOSE RATE RADIATION
0.8
0.6
0.4 ^BIASED
Vs = ±18V
0.2
0
-0.2 GROUNDED
-0.4
-0.6
-0.8
0
10 20 30 40 50 60 70 80 90 100
krad (Si)
FIGURE 59. I^- SHIFT vs LOW DOSE RATE RADIATION
18
FN8411.1
June 14, 2013