ISL70444SEH Datasheet, PDF (17/23 Pages) Intersil Corporation – 19MHz Rad Hard 40V Quad Rail-to-Rail Input-Output, Low-Power Operational Amplifiers

ISL70444SEH
Post High Dose Rate Radiation Characteristics Unless otherwise specified, V_S ± 18V,
V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a high dose rate of 50 to 300rad(Si)/s. This data is
intended to show typical parameter shifts due to high dose rate radiation. These are not limits nor are they guaranteed.
30
30
Vs = ±18V
Vs = ±18V
20
20
GROUNDED
10
10
0
GROUNDED
-10
BIASED
-20
0
BIASED
-10
-20
-30
0
50
100
150
200
250
300
krad (Si)
FIGURE 50. V_OS SHIFT vs HIGH DOSE RATE RADIATION
-30
0
50
100
150
200
250
300
krad (Si)
FIGURE 51. I_BIAS SHIFT vs HIGH DOSE RATE RADIATION
0.8
0.6
Vs = ±18V
0.4
BIASED
0.2
0
GROUNDED
-0.2
-0.4
-0.6
-0.8
0
50
100
150
200
250
300
krad (Si)
FIGURE 52. I^- SHIFT vs HIGH DOSE RATE RADIATION
0.8
0.6
Vs = ±18V
0.4
0.2
0
GROUNDED
-0.2
BIASED
-0.4
-0.6
-0.8
0
50
100
150
200
250
300
krad (Si)
FIGURE 53. I⁺ SHIFT vs HIGH DOSE RATE RADIATION
2.0
1.5
Vs = ±18V
1.0
0.5
BIASED
0
-0.5
GROUNDED
-1.0
-1.5
-2.0
0
50
100
150
200
250
300
krad(Si)
FIGURE 54. I_OS SHIFT vs HIGH DOSE RATE RADIATION
17
FN8411.1
June 14, 2013