ISL71831SEH Datasheet, PDF (16/21 Pages) Intersil Corporation – Radiation Hardened 5V 32-Channel Analog Multiplexer

ISL71831SEH
Post Low Dose Rate Radiation Characteristics (V⁺ = 3.3V) Unless otherwise
specified, V⁺ = 3.3V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed. (Continued)
5.0
1.0
4.5
0.8
4.0
0.6
3.5
0.4
GROUNDED
3.0
0.2
2.5
2.0
BIASED
0.0
GROUNDED
-0.2
1.5
-0.4
BIASED
1.0
-0.6
0.5
-0.8
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
-1.00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 47. r_DS(ON) MATCH (V⁺ = 3V, V_IN = 2.5V)
FIGURE 48. I_S(OFF) (V⁺ = 3.6V, V_IN = 3.1V)
1.0
0.8
0.6
0.4
GROUNDED
0.2
0.0
-0.2
-0.4 BIASED
-0.6
-0.8
-1.00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 49. I_S(OFF) (V⁺ = 3.6V, V_IN = 7V)
5.5
5.0
4.5
4.0
BIASED
3.5
GROUNDED
3.0
2.5
2.0
1.5
1.0
0.5
0
0
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 50. I_S(ON) (V⁺ = 3.6V, V_IN = 7V)
1.0
0.8
0.6
0.4 ^BIASED
GROUNDED
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 51. I_D(ON) (V⁺ = 3.6V, V_IN = 3.1V)
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1.0
0.8
0.6
0.4
0.2
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
0
BIASED
GROUNDED
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 52. I_D(OFF) (V⁺ = 3.6V, V_IN = 3.1V)
FN8759.2
November 18, 2016