ISL71831SEH Datasheet, PDF (13/21 Pages) Intersil Corporation – Radiation Hardened 5V 32-Channel Analog Multiplexer

ISL71831SEH
Post Low Dose Rate Radiation Characteristics (V⁺ = 5V) Unless otherwise specified,
V⁺ = 5V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This data is
intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
120
120
100
80
V_IN = 0.5V
100
80
V_IN = 0.5V
60
60
40
V_IN = 2.25V
V_IN = 4V
20
40
V_IN = 2.25V
20
V_IN = 4V
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 29. r_DS(ON) (V⁺ = 4.5V), BIASED
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 30. r_DS(ON) (V⁺ = 4.5V), GROUNDED
120
100
80
GROUNDED
60
40
20
BIASED
0
0
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 31. r_DS(ON) MINIMUM (V⁺ = 4.5V)
120
100
GROUNDED
80
60
40
BIASED
20
0
0
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 32. r_DS(ON) MAXIMUM (V⁺ = 4.5V)
45
40
35
30
GROUNDED
25
BIASED
20
15
10
5
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 33. r_DS(ON) FLATNESS (V⁺ = 4.5V)
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5.0
4.5
4.0
3.5
3.0
2.5 _GROUNDED
2.0
1.5
BIASED
1.0
0.5
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 34. r_DS(ON) MATCH (V⁺ = 4.5V, V_IN = 0.5V)
FN8759.2
November 18, 2016