ISL71831SEH Datasheet, PDF (15/21 Pages) Intersil Corporation – Radiation Hardened 5V 32-Channel Analog Multiplexer

ISL71831SEH
Post Low Dose Rate Radiation Characteristics (V⁺ = 3.3V) Unless otherwise
specified, V⁺ = 3.3V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This
data is intended to show typical parameter shifts due to low dose rate radiation. These are not limits nor are they guaranteed.
120
120
100
100
80
80
60
V_IN = 2.5V
40
V_IN = 1.5V
V_IN = 0.5V
60
V_IN = 1.5V
V_IN = 2.5V
40
V_IN = 0.5V
20
20
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 41. r_DS(ON) (V⁺ = 3V), BIASED
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 42. r_DS(ON) (V⁺ = 3V) - GROUNDED
120
100 _BIASED
80
GROUNDED
60
40
20
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 43. r_DS(ON) MINIMUM (V⁺ = 3V)
45
40
35
GROUNDED
30
25
20
BIASED
15
10
5
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 45. r_DS(ON) FLATNESS (V⁺ = 3V)
120
100
80
BIASED
60
GROUNDED
40
20
00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 44. r_DS(ON) MAXIMUM (V⁺ = 3V)
5.0
4.5
4.0
3.5
3.0
2.5
GROUNDED
2.0
1.5
1.0
0.5
BIASED
0.00
10 20 30 40 50 60 70 80
LOW DOSE RATE RADIATION (krad(Si))
FIGURE 46. r_DS(ON) MATCH (V⁺ = 3V, V_IN = 0.5V)
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FN8759.2
November 18, 2016