ISL70417SEH Datasheet, PDF (16/22 Pages) Intersil Corporation – Rad Hard 40V Quad Precision Low Power Operational Amplifiers

ISL70417SEH
Post Low Dose Radiation Characteristics Unless otherwise specified, V_S ± 15V, V_CM = 0, V_O = 0V, T_A = +25°C. This data is
typical mean test data post radiation exposure at a low dose rate of <10mrad(Si)/s. This data is intended to show typical parameter shifts due to low
dose rate radiation. These are not limits nor are they guaranteed
0.7
0.6
BIAS
0.5
0.4
GND
0.3
0.2
0.1
0
0
20
40
60
80
100
krad(Si)
FIGURE 48. SUPPLY CURRENT PER AMP vs LOW DOSE RATE
RADIATION
110
90
70
50
30
GND
10
-10
BIAS
-30
-50
-70
-90
-110
0 10 20 30 40 50 60 70 80 90 100
krad(Si)
FIGURE 49. V_OS vs LOW DOSE RATE RADIATION
5
4
3
BIAS
2
1
0
GND
-1
-2
-3
-4
-5
0
20
40
60
80
100
krad(Si)
FIGURE 50. I_B+ vs LOW DOSE RATE RADIATION
5
4
3
BIAS
2
1
0
-1
GND
-2
-3
-4
-5
0
20
40
60
80
100
krad(Si)
FIGURE 51. I_B- vs LOW DOSE RATE RADIATION
3
2
1
GND
0
-1
BIAS
-2
-3
0
20
40
60
80
100
krad(Si)
FIGURE 52. I_OSvs LOW DOSE RATE RADIATION
16
July 2, 2012
FN7962.0