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X9251_07 Datasheet, PDF (13/20 Pages) Intersil Corporation – Quad Digitally-Controlled (XDCP™) Potentiometer
X9251
DC Operating Characteristics (Over the recommended operating conditions unless otherwise specified.)
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
MIN.
TYP
MAX
ICC1
ICC2
ISB
VCC supply current
(active)
VCC supply current
(non-volatile write)
VCC current (standby)
ILI
ILO
VIH
VIL
VOL
VOH
VOH
Input leakage current
Output leakage current
Input HIGH voltage
Input LOW voltage
Output LOW voltage
Output HIGH voltage
Output HIGH voltage
fSCK = 2.5 MHz, SO = Open, VCC = 6V
Other Inputs = VSS
fSCK = 2.5MHz, SO = Open, VCC = 6V
Other Inputs = VSS
SCK = SI = VSS, Addr. = VSS,
CS = VCC = 6V
VIN = VSS to VCC
VOUT = VSS to VCC
IOL = 3mA
IOH = -1mA, VCC ≥ +3V
IOH = -0.4mA, VCC ≤ +3V
400
1
5
3
VCC x 0.7
VCC - 0.8
VCC - 0.4
10
10
VCC x 0.3
0.4
UNITS
μA
mA
μA
μA
μA
V
V
V
V
V
Endurance and Data Retention
PARAMETER
Minimum endurance
Data retention
MIN
100,000
100
UNITS
Data changes per bit per register
years
Capacitance
SYMBOL
TEST
CIN/OUT (Note 6) Input/Output capacitance (SI)
COUT (Note 6) Output capacitance (SO)
CIN (Note 6) Input capacitance (A0, A1, CS, WP, HOLD, and SCK)
TEST CONDITIONS
TYP
VOUT = 0V
8
VOUT = 0V
8
VIN = 0V
6
UNITS
pF
pF
pF
Power-Up Timing
SYMBOL
PARAMETER
tr VCC (Note 6)
tPUR (Note 7)
tPUW (Note 7)
VCC Power-up rate
Power-up to initiation of read operation
Power-up to initiation of write operation
MIN
MAX
UNITS
0.2
V/ms
1
ms
50
ms
A.C. Test Conditions
Input Pulse Levels
Input rise and fall times
Input and output timing level
VCC x 0.1 to VCC x 0.9
10ns
VCC x 0.5
NOTES:
6. This parameter is not 100% tested
7. tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued. These
parameters are periodically sampled and not 100% tested.
13
FN8166.5
April 13, 2007