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X9279_09 Datasheet, PDF (12/18 Pages) Intersil Corporation – Single Digitally-Controlled (XDCP™) Potentiometer
X9279
DC Electrical Specifications Over the recommended Operating Conditions unless otherwise specified.
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
TYP
ICC1
VCC Supply Current (Active)
fSCL = 400kHz; VCC = +6V; SDA = Open;
(for 2-Wire, Active, Read and Volatile Write States
only)
ICC2
VCC Supply Current
(Non-volatile Write)
fSCL = 400kHz; VCC = +6V; SDA = Open
(for 2-Wire, Active, Non-volatile Write State only)
ISB
VCC Current (Standby)
VCC = +6V; VIN = VSS or VCC; SDA = VCC
(for 2-Wire, Standby State only)
ILI
Input Leakage Current
VIN = VSS to VCC
ILO
Output Leakage Current
VOUT = VSS to VCC
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
VOL
Output LOW Voltage
IOL = 3mA
VCC x 0.7
-1
MAX
3
5
5
10
10
VCC + 1
VCC x 0.3
0.4
UNITS
mA
mA
µA
µA
µA
V
V
V
Endurance and Data Retention
PARAMETER
Minimum Endurance
Data Retention
MIN
100,000
100
UNITS
Data changes per bit per register
years
Capacitance
SYMBOL
TEST
TYP
CIN/OUT
Input /Output capacitance (SDA)
8
CIN
Input capacitance (SCL, WP, A2, A1 and A0)
6
UNITS
pF
pF
TEST CONDITIONS
VOUT = 0V
VIN = 0V
Power-Up Timing
SYMBOL
PARAMETER
MIN
MAX
UNITS
tr VCC (Note 15) VCC Power-up rate
0.2
50
V/ms
tPUR (Note 16) Power-up to initiation of read operation
1
ms
tPUW (Note 16) Power-up to initiation of write operation
50
ms
NOTES:
15. This parameter is not 100% tested.
16. tPUR and tPUW are the delays required from the time the (last) power supply (VCC-) is stable until the specific instruction can be issued. These
parameters are periodically sampled and not 100% tested.
AC Test Conditions
Input Pulse Levels
Input rise and fall times
Input and output timing level
VCC x 0.1 to VCC x 0.9
10ns
VCC x 0.5
12
FN8175.4
September 23, 2009