ISL75051SEH Datasheet, PDF (10/18 Pages) Intersil Corporation – 3A, Rad Hard, Positive, Ultra Low Dropout Regulator

ISL75051SEH
Post Radiation Characteristics for High Dose and Low Dose T_A = +25°C, unless otherwise noted. This data is typical
test data post radiation exposure at a rate of 10mrad(Si)/s for low dose rate and 50-300rad(Si)/s for high dose rate. This data is intended to show typical
parameter shifts due to HDR (High Dose Rate) or LDR (Low Dose Rate) radiation. These are not limits nor are they guaranteed.
1.525
1.520
1.515
1.510
1.505
1.500
1.495
1.490
1.485
1.480
1.475
0
SPEC LIMIT
LDR BIAS
HDR BIAS
LDR GROUND ^{HDR GROUND}
SPEC LIMIT
50
100
150
TOTAL DOSE, krad(Si)
POST
ANNEAL
1.525
1.520
1.515
1.510
1.505
1.500
1.495
1.490
1.485
1.480
1.475
0
SPEC LIMIT
LDR BIAS
HDR BIAS
LDR GROUND HDR GROUND
SPEC LIMIT
50
100
150
TOTAL DOSE, krad(Si)
POST
ANNEAL
FIGURE 3. DC OUTPUT VOLTAGE, 1.5V_OUT, 3.6V_IN NO LOAD
FIGURE 4. DC OUTPUT VOLTAGE, 1.5V_OUT, 3.6V_IN, 3A LOAD
20
18
LDR BIAS
16
SPEC LIMIT
CONTROL
HDR BIAS
14
LDR GROUND
12
HDR GROUND
10
8
SPEC LIMIT
6
0
50
100
150
POST
TOTAL DOSE, krad(Si)
ANNEAL
FIGURE 5. GROUND PIN CURRENT, 1.5V_OUT, 6.0V_IN, NO LOAD
350
300
LDR BIAS
250
SPEC LIMIT
CONTROL
HDR GROUND
200
150
LDR GROUND
HDR BIAS
100
SPEC LIMIT
50
0
0
50
100
150
POST
TOTAL DOSE, krad(Si)
ANNEAL
FIGURE 6. DROPOUT VOLTAGE, 2.5V_OUT, 3A LOAD CURRENT
8
7
LDR BIAS
6
SPEC LIMIT
HDR BIAS
CONTROL
5
LDR GROUND
HDR GROUND
SPEC LIMIT
4
0
50
100
150
POST
TOTAL DOSE, krad(Si)
ANNEAL
FIGURE 7. OUTPUT SHORT CIRCUIT CURRENT, R_SET = 511Ω, 2.2V_IN
1.8
1.6
LDR BIAS
1.4
SPEC LIMIT
HDR BIAS
CONTROL
1.2
LDR GROUND
1.0
HDR GROUND
0.8
0.6
0.4
0
SPEC LIMIT
50
100
150
TOTAL DOSE, krad(Si)
POST
ANNEAL
FIGURE 8. OUTPUT SHORT CIRCUIT CURRENT, R_SET = 5.11k, 6.0V_IN
10
FN8294.0
August 28, 2012