TLE5010 Datasheet, PDF (46/56 Pages) Infineon Technologies AG – GMR Based Angular Sensor

Draft
ADC Test Vectors
TLE5010
Test Structures
Y
122.1%
141.4%
0%
100.0%
X
70.7%
Figure 14 ADC Test Vectors
11.2
Temperature Measurement
An internal bandgap voltage can be used to measure the temperature on the chip.
This may be used to compensate temperature dependent errors.
The temperature value is sent out instead of the X value.
Table 18 Temperature Measurement
Parameter
Symbol Limit Values
min. typ.
Value at -40°C
T_-40
-
-
Value at 25°C
T₂₅
+2550 +5775
Value at 150°C
T₁₅₀
-22000 -
Temperature Sensitivity S_T
-
-188.75
1) _{Should be used for temperature compensation of offset errors}
Unit Notes
max.
+22000 digits
+9000 digits
-
digits
-
dig / K ¹⁾
Preliminary Data Sheet
46
V 0.9, 2007-05