ICB2FL01G Datasheet, PDF (36/56 Pages) Infineon Technologies AG – Smart Ballast Control IC for Fluorescent Lamp Ballasts

2^nd Generation FL-Controller for FL-Ballasts
Functional Description
2.8.3 Built in Customer Test Mode (Clock Acceleration)
The built in customer test mode, supported by this IC, saves testing time for customers in terms of
ballast end test. In that mode, the IC accelerates the internal clock in order to reduce the time of the 4
different procedures by the following factors (see Table 1).
Phase
Preheating
Time Out Ignition
Pre Run Mode
EOL2
Duration for Test [ms]
625
118.5
41.7
41.7
Acceleration Factor
4
2
15
60
Nominal Duration [ms]
2500 (max)
237
625
2500
Table 1: Specified Acceleration Factors
2.8.3.1
Enabling of the Clock Acceleration
The clock acceleration (Built in Customer Test Mode) is activated when the chip supply voltage
exceeds V_CC > 14.1V and the voltages at the Run Frequency and Preheating Frequency pin are set to
V_RFRUN = V_RFPH = 5.0 V (± 5 %) see Figure 35 “Enabling of Clock Acceleration”. A RES pin voltage of
V_RES > 3.5 V up to 5.0 V (± 5 %) prevents a power up of the IC, the IC remains in a mode before
powering up. This status is hold as long as the voltage at the RES pin is at V_RES > 3.5 V up to 5.0 V (±
5 %) – no power up. Note: after the activation of the clock acceleration mode, the voltage level of 5.0V
at the Run Frequency and Preheating Frequency pin (V_RFRUN = V_RFPH) can be released.
2.8.3.2
Starting the Chip with accelerated Clock
In order to start the IC with an accelerated clock, set the voltage at the RES pin to GND (V_RES = 0 V).
Figure 36 “Starting the Chip with an accelerated Clock”. The IC powers up the system and starts
working with an accelerated clock. Now the duration of the different modes are accelerated by Factors
shown in Table 1
Figure 36: Clock Acceleration (Built in Customer Test Mode)
Datasheet
Page 36 of 56
ICB2FL01G
V1.2