ICB2FL01G Datasheet, PDF (33/56 Pages) Infineon Technologies AG – Smart Ballast Control IC for Fluorescent Lamp Ballasts

2^nd Generation FL-Controller for FL-Ballasts
2.8 Built in Customer Test Mode Operation
Functional Description
In order to decrease the final ballast testing time for customers, the 2^nd generation of ballast IC
supports an integrated built in Customer Test Mode and several functions to disable some features
and states of the IC.
2.8.1 Pre Heating Test Mode
This feature forces the IC to stay in the pre heating mode (see chapter 2.8.1.2) or to starts the ignition
immediately without any preheating (see chapter 2.8.1.1 skip pre heating). A resistor at this pin
defines the duration of the pre heating phase. Normally, the pre heating phase is in a range of 0ms up
to 2500ms set via a resistor R_RTPH = 0Ω up to 25kΩ from the RTPH pin to GND. The pre heating phase
is skipped when the RTHP pin is set to GND. If the signal at this pin is V_RTPH > 5.0 V, the IC remains in
the pre heating mode.
2.8.1.1
Skip the Pre Heating Phase – Set RTPH Pin to GND
The Pre Heating phase can be skipped in set the RTPH pin 11 to GND. Figure 30 shows a standard
start up with a set pre heating time via resistor at the RTPH pin 11 to GND (e.g. 8.2 kΩ this is equal to
a pre heating phase of app. 820ms). The pre heating phase can be skipped in setting the RTPH pin 11
directly to GND. In that case, the ignition is directly after the soft start phase.
Figure 30: Start UP WITH Pre Heating
Figure 31: Start UP WITHOUT Pre Heating
Datasheet
Page 33 of 56
ICB2FL01G
V1.2