TLE6240GP_10 Datasheet, PDF (25/37 Pages) Infineon Technologies AG – Smart 16-Channel Low-Side Switch

TLE6240GP
Smart 16-Channel Low-Side Switch
Control of the Device
6.1.5.2 Control Byte No. 2 and 7
Table 5
MSB
Control Byte No. 2 and 7
H
H
L
L
X
X
X
Control Byte
Comment
X
Reading back of the eight inputs and ‘1-bit
Diagnosis’ provided
If the TLE6240GP is used as bare die in a hybrid application, it is necessary to know if proper connections exist
between the µC-port and parallel inputs. By entering ‘HHLL’ as the control word, the first eight bits of the SO give
the state of the parallel inputs, depending on the µC signals. By comparing the IN-bits with the corresponding
µC-port signal, the necessary connection between the µC and the TLE6240GP can be verified - i.e. ‘read back of
the inputs’.
The second 8-bits fed out at the serial output contains ‘1-bit’ fault information of the outputs (H = no fault, L = fault).
In the expression given below for the output byte, ‘FX’ is the fault bit for channel X.
Table 6 Serial Output
MSB
LSB
IN12 IN11 IN10 IN9 IN4 IN3 IN2 IN1 FX FX FX FX FX FX FX FX
Parallel Input Signals
Fault Bits Channel 1 to 8 or 9 to 16
CS
SI
HHLL LLLL XXXX XXXX
SO H H H H H H H H H H H H H H H H
SI command: No change of the output states; reading back of
the 8 inputs and 1bit diagnosis for channels 1 to 8
SO diagnosis: No fault, normal function of channels 1 to 8 or 9 to
16 depending on previous SI command
CS
SI
HHLL HHHH XXXX XXXX
SO
State of 8 par. inputs 1bit diagnosis Ch.1..8
SI command: No change of the output states; reading back of
the 8 inputs and 1bit diagnosis for channels 9 to 16 provided
during next chip select cycle
SO diagnosis: State of eight parallel inputs and 1 bit diagnosis
performed for channels 1 to 8
Figure 17 Example for two Consecutive Chip Select Cycles
Data Sheet
25
Rev.3.3, 2010-02-15