ICS85408I Datasheet, PDF (5/16 Pages) Integrated Device Technology – Low Skew, 1-to-8, Differential-to-LVDS Clock

ICS85408I Datasheet
LOW SKEW, 1-TO-8, DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
Table 4D. LVDS DC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
V_OD
∆V_OD
V_OS
∆V_OS
I_Oz
I_OFF
I_OSD
Differential Output Voltage
V_OD Magnitude Change
Offset Voltage
V_OS Magnitude Change
High Impedance Leakage
Power Off Leakage
Differential Output Short
Circuit Current
R_L = 100Ω
R_L = 100Ω
R_L = 100Ω
R_L = 100Ω
I_OS/I_OSB Output Short Circuit Current
Minimum
250
1.125
-10
-1
Typical
400
1.4
Maximum
600
50
1.6
50
+10
+1
-5.5
-12
Units
mV
mV
V
mV
µA
µA
mA
mA
Table 5. AC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
f_MAX
t_PD
tjit
Output Frequency
Propagation Delay; NOTE 1
Buffer Additive Phase Jitter, RMS;
refer to Additive Phase Jitter
Section
156.25MHz,
Integration Range: (12kHz – 20MHz)
tsk(o)
Output Skew; NOTE 2, 4
tsk(pp) Part-to-Part Skew; NOTE 3, 4
t_R / t_F
odc
Output Rise/Fall Time
Output Duty Cycle
20% to 80%
t_PZL, t_PZH Output Enable Time; NOTE 5
t_PLZ, t_PHZ Output Disable Time; NOTE 5
Minimum
1.6
Typical
Maximum
700
2.4
Units
MHz
ns
167
fs
50
ps
550
ps
50
600
ps
45
55
%
5
ns
5
ns
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device is
mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal equilibrium
has been reached under these conditions.
NOTE: All parameters measured at f_MAX unless noted otherwise.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs at the same supply voltage and with equal load conditions. Measured at the differential crossing
point of the input to the differential output crossing point.
NOTE 3: Defined as skew between outputs on different devices operating at the same supply voltages and with equal load conditions. Using
the same type of inputs on each device, the outputs are measured at the differential cross points.
NOTE 4: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 5: These parameters are guaranteed by characterization. Not tested in production.
ICS85408BGI REVISION B JULY 2, 2009
5
©2009 Integrated Device Technology, Inc.