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ICS85408I Datasheet, PDF (4/16 Pages) Integrated Device Technology – Low Skew, 1-to-8, Differential-to-LVDS Clock
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ICS85408I Datasheet
LOW SKEW, 1-TO-8, DIFFERENTIAL-TO-LVDS CLOCK DISTRIBUTION CHIP
Absolute Maximum Ratings
NOTE: Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These ratings are stress
specifications only. Functional operation of product at these conditions or any conditions beyond those listed in the DC Characteristics or AC
Characteristics is not implied. Exposure to absolute maximum rating conditions for extended periods may affect product reliability.
Item
Supply Voltage, VDD
Inputs, VI
Outputs, IO (LVDS)
Continuos Current
Surge Current
Package Thermal Impedance, θJA
Storage Temperature, TSTG
Rating
4.6V
-0.5V to VDD + 0.5V
10mA
15mA
70°C/W (0 mps)
-65°C to 150°C
DC Electrical Characteristics
Table 4A. LVDS Power Supply DC Characteristics,VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
Typical
VDD
Positive Supply Voltage
IDD
Power Supply Current
3.135
3.3
Maximum
3.465
90
Units
V
mA
Table 4B. LVCMOS/LVTTL DC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
VIH
Input High Voltage
VIL
Input Low Voltage
IIH
Input High Current
IIL
Input Low Current
VDD = VIN = 3.465V
VDD = 3.465V, VIN = 0V
2
-0.3
-150
Typical
Maximum
VDD + 0.3
0.8
5
Units
V
V
µA
µA
Table 4C. Differential DC Characteristics, VDD = 3.3V ± 5%, TA = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
IIH
IIL
VPP
VCMR
Input High Current
CLK
nCLK
Input Low Current
CLK
nCLK
Peak-to-Peak Voltage; NOTE 1
Common Mode Input Voltage; NOTE 1, 2
VDD = VIN = 3.465V
VDD = VIN = 3.465V
VDD = 3.465V, VIN = 0V
VDD = 3.465V, VIN = 0V
-5
-150
0.15
GND + 0.5
NOTE 1: VIL should not be less than -0.3V.
NOTE 2: Common mode input voltage is defined as VIH.
Typical
Maximum
150
5
1.3
VDD – 0.85
Units
µA
µA
µA
V
V
ICS85408BGI REVISION B JULY 2, 2009
4
©2009 Integrated Device Technology, Inc.
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