ICS854S01I Datasheet, PDF (4/17 Pages) Integrated Device Technology – 2:1 Differential-to-LVDS Multiplexer

ICS854S01I Datasheet
2:1 DIFFERENTIAL-TO-LVDS MULTIPLEXER
Table 4D. LVDS DC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol Parameter
Test Conditions
Minimum
V_OD
V_OD
V_OS
V_OS
Differential Output Voltage
V_OD Magnitude Change
Offset Voltage
V_OS Magnitude Change
247
1.125
Typical
Maximum
454
50
1.375
50
Units
mV
mV
V
mV
AC Electrical Characteristics
Table 5. AC Characteristics, V_DD = 3.3V ± 5%, T_A = -40°C to 85°C
Symbol
Parameter
Test Conditions
f_OUT
t_PD
Output Frequency
Propagation Delay;
NOTE 1
tjit
tsk(pp)
t_R / t_F
odc
Buffer Additive Phase Jitter,
RMS; refer to Additive Phase
Jitter Section
Part-to-Part Skew;
NOTE 2, 3
Output Rise/Fall Time
Output Duty Cycle
155.52MHz, Integration Range:
12kHz – 20MHz)
20% to 80%
MUX__ISOLATION
MUX Isolation;
NOTE 4
f_OUT = 155.52MHz, V_PP =
400mV
Minimum
250
100
49
Typical
400
0.06
86
Maximum
2.5
600
Units
GHz
ps
ps
350
ps
275
ps
51
%
dB
NOTE: Electrical parameters are guaranteed over the specified ambient operating temperature range, which is established when the device
is mounted in a test socket with maintained transverse airflow greater than 500 lfpm. The device will meet specifications after thermal
equilibrium has been reached under these conditions.
NOTE: All parameters measured at  1.0GHz unless otherwise noted.
NOTE 1: Measured from the differential input crossing point to the differential output crossing point.
NOTE 2: Defined as skew between outputs on different devices operating at the same supply voltage, same temperature, same frequency
and
with equal load conditions. Using the same type of inputs on each device, the outputs are measured
at the differential cross points.
NOTE 3: This parameter is defined in accordance with JEDEC Standard 65.
NOTE 4: Q, nQ outputs measured differentially. See Parameter Measurement Information to MUX Isolation diagram.
ICS854S01AKI June 15, 2017
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©2017 Integrated Device Technology, Inc.