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ICS854S01I Datasheet, PDF (13/17 Pages) Integrated Device Technology – 2:1 Differential-to-LVDS Multiplexer
ICS854S01I Datasheet
2:1 DIFFERENTIAL-TO-LVDS MULTIPLEXER
Power Considerations
This section provides information on power dissipation and junction temperature for the ICS854S01I.
Equations and example calculations are also provided.
1. Power Dissipation.
The total power dissipation for theICS854S01I is the sum of the core power plus the power dissipated in the load(s).
The following is the power dissipation for VDD = 3.3V + 5% = 3.465V, which gives worst case results.
NOTE: Please refer to Section 3 for details on calculating power dissipated in the load.
• Power (core)MAX = VDD_MAX * IDD_MAX = 3.465V * 40mA = 138.6mW
2. Junction Temperature.
Junction temperature, Tj, is the temperature at the junction of the bond wire and bond pad directly affects the reliability of the device. The
maximum recommended junction temperature is 125°C. Limiting the internal transistor junction temperature, Tj, to 125°C ensures that the bond
wire and bond pad temperature remains below 125°C.
The equation for Tj is as follows: Tj = JA * Pd_total + TA
Tj = Junction Temperature
JA = Junction-to-Ambient Thermal Resistance
Pd_total = Total Device Power Dissipation (example calculation is in section 1 above)
TA = Ambient Temperature
In order to calculate junction temperature, the appropriate junction-to-ambient thermal resistance JA must be used. Assuming no air flow and
a multi-layer board, the appropriate value is 74.7°C/W per Table 6 below.
Therefore, Tj for an ambient temperature of 85°C with all outputs switching is:
85°C + 0.139W * 74.7°C/W = 95.4°C. This is well below the limit of 125°C.
This calculation is only an example. Tj will obviously vary depending on the number of loaded outputs, supply voltage, air flow and the type of
board (multi-layer).
Table 6. Thermal Resistance JA for 16 Lead VFQFN, Forced Convection
JA by Velocity
Meters per Second
0
Multi-Layer PCB, JEDEC Standard Test Boards
74.7°C/W
1
65.3°C/W
2.5
58.5°C/W
ICS854S01AKI June 15, 2017
13
©2017 Integrated Device Technology, Inc.