HY62LF16404D Datasheet, PDF (5/10 Pages) Hynix Semiconductor – 256Kx16bit full CMOS SRAM

HY62LF16404D Series
AC CHARACTERISTICS
TA = -40°C to 85°C, unless otherwise specified
# Symbol
Parameter
70ns
85ns
Unit
Min. Max. Min. Max.
READ CYCLE
1 tRC
Read Cycle Time
70
-
85
-
ns
2 tAA
Address Access Time
-
70
-
85
ns
3 tACS
Chip Select Access Time
-
70
-
85
ns
4 tOE
Output Enable to Output Valid
-
35
-
40
ns
5 tBA
/LB, /UB Access Time
-
70
-
85
ns
6 tCLZ
Chip Select to Output in Low Z
10
-
10
-
ns
7 tOLZ
Output Enable to Output in Low Z
5
-
5
-
ns
8 tBLZ
/LB, /UB Enable to Output in Low Z
10
-
10
-
ns
9 tCHZ
Chip Deselection to Output in High Z
0
30
0
30
ns
10 tOHZ Out Disable to Output in High Z
0
30
0
30
ns
11 tBHZ
/LB, /UB Disable to Output in High Z
0
30
0
30
ns
12 tOH
Output Hold from Address Change
10
-
10
-
ns
WRITE CYCLE
13 tWC
Write Cycle Time
70
-
85
-
ns
14 tCW
Chip Selection to End of Write
60
-
70
-
ns
15 tAW
Address Valid to End of Write
60
-
70
-
ns
16 tBW
/LB, /UB Valid to End of Write
60
-
70
-
ns
17 tAS
Address Set-up Time
0
-
0
-
ns
18 tWP
Write Pulse Width
50
-
60
-
ns
19 tWR
Write Recovery Time
0
-
0
-
ns
20 tWHZ Write to Output in High Z
0
20
0
25
ns
21 tDW
Data to Write Time Overlap
30
-
35
-
ns
22 tDH
Data Hold from Write Time
0
-
0
-
ns
23 tOW
Output Active from End of Write
5
-
5
-
ns
AC TEST CONDITIONS
TA = -40°C to 85°C, unless otherwise specified
Parameter
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Level
Output Load tCLZ, tOLZ, tBLZ, tCHZ, tOHZ, tBHZ, tWHZ, tOW
Others
Value
0.4V to 2.2V
5ns
1.1V
CL = 5pF + 1TTL Load
CL = 30pF + 1TTL Load
AC TEST LOADS
V_TM=2.3V
D_OUT
3067 Ohm
CL(1)
3345 Ohm
Note 1. Including jig and scope capacitance:
Rev.03 / Aug.01
4