HY628100A Datasheet, PDF (4/9 Pages) Hynix Semiconductor – 128Kx8bit CMOS SRAM

AC TEST CONDITIONS
TA = 0°C to 70°C (Normal), unless otherwise specified
PARAMETER
Value
Input Pulse Level
0.8V to 2.4V
Input Rise and Fall Time
5ns
Input and Output Timing Reference Level
1.5V
Output Load
CL = 100pF + 1TTL Load
CL* = 30pF + 1TTL Load
Comment
* : Test load is 30pF for 50ns
AC TEST LOADS
TTL
CL(1)
HY628100A Series
Note : Including jig and scope capacitance
CAPACITANCE
Temp = 25°C, f= 1.0MHz
Symbol
Parameter
Condition Max.
Unit
CIN
Input Capacitance
VIN = 0V
6
pF
COUT
Output Capacitance VI/O = 0V
8
pF
Note : These parameters are sampled and not 100% tested
Rev.05 /Feb.99
4