HY29F400 Datasheet, PDF (24/40 Pages) Hynix Semiconductor – 4 Megabit (512Kx8/256Kx16) 5 Volt-only Flash Memory

HY29F400
AC CHARACTERISTICS
Read Operations
Parameter
JEDEC Std
Description
t_AVAV
t_RC Read Cycle Time ¹
t_AVQV
t_ACC Address to Output Delay
t_ELQV
t_EHQZ
t_GLQV
t_GHQZ
t_CE Chip Enable to Output Delay
t_DF Chip Enable to Output High Z ¹
t_OE Output Enable to Output Delay
t_DF Output Enable to Output High Z ¹
t_OEH
Output Enable
Hold Time ¹
Read
Toggle and
Data# Polling
t_AXQX
t_OH
Output Hold Time from Addresses, CE#
or OE#, Whichever Occurs First ¹
Notes:
1. Not 100% tested.
2. See Figure 11 and Table 7 for test conditions.
Test Setup
Speed Option
Unit
- 45 - 55 - 70 - 90
Min 45 55 70 90 ns
CE# = V_IL
OE# = V_IL
Max
45
55
70
90
ns
OE# = V_IL Max 45 55 70 90 ns
Max 15 15 20 20 ns
CE# = V_IL Max 25 25 30 35 ns
Max 15 15 20 20 ns
Min
0
ns
Min
10
ns
Min
0
ns
Addresses
CE#
t_RC
Addresses Stable
t_ACC
OE#
WE#
Outputs
t_OE
t_OEH
t_DF
t_CE
t_OH
Output Valid
RESET#
RY/BY#
0V
24
Figure 13. Read Operation Timings
Rev. 5.2/May 01