HY29F400 Datasheet, PDF (23/40 Pages) Hynix Semiconductor – 4 Megabit (512Kx8/256Kx16) 5 Volt-only Flash Memory

KEY TO SWITCHING WAVEFORMS
WAVEFORM
INPUTS
Steady
HY29F400
OUTPUTS
Changing from H to L
Changing from L to H
Don't Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Centerline is High Impedance State
(High Z)
TEST CONDITIONS
+ 5V
DEVICE
UNDER
TEST
C_L
6.2
KOhm
2.7
KOhm
All diodes
are
1N3064
or
equivalent
Figure 11. Test Setup
Table 7. Test Specifications
Test
Condition
- 45
- 55
- 70
- 90
Unit
Output Load
1 TTL Gate
Output Load Capacitance
(C_L)
Input Rise and Fall Times
30 30 100 pF
5 5 20 ns
Input Signal Low Level
0.0 0.45 0.45 V
Input Signal High Level
3.0 2.4 2.4 V
Low Timing Measurement
Signal Level
1.5 0.8 0.8 V
High Timing Measurement
Signal Level
1.5 2.0 2.0 V
3.0 V
Input 1.5 V
Measurement Level
1.5 V
0.0 V
HY29F400-45 Version
2.4 V
0.45 V
Input
2.0 V
0.8 V
Measurement
Levels
2.0 V
0.8 V
HY29F400-55, -70, -90 Versions
Figure 12. Input Waveforms and Measurement Levels
Rev. 5.2/May 01
Output
Output
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