HY27UH08AG5B Datasheet, PDF (20/51 Pages) Hynix Semiconductor – 16Gbit (2Gx8bit) NAND Flash

1
HY27UH08AG5B Series
16Gbit (2Gx8bit) NAND Flash
Item
Symbol
Test Condition
Min
Input / Output Capacitance
CI/O
VIL=0V
-
Input Capacitance
CIN
VIN=0V
-
Table 10: Pin Capacitance (TA=25C, F=1.0MHz)
Max
40
40
Unit
pF
pF
Parameter
Symbol
Program Time / Multi-Plane Program Time
tPROG
Dummy Busy Time for Two Plane Program
tDBSY
Number of partial Program Cycles in the same page
NOP
Block Erase Time / Multi-Plane Block Erase Time
tBERS
Read Cache Busy Time
tRCBSY
Table 11: Program / Erase Characteristics
Min Typ Max Unit
- 200 700 us
-
0.5
1
us
-
-
8 Cycles
-
1.5
2
ms
-
3
tR
us
Rev 0.2 / Jan. 2008
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