HY27UH08AG5B Datasheet, PDF (17/51 Pages) Hynix Semiconductor – 16Gbit (2Gx8bit) NAND Flash

1
HY27UH08AG5B Series
16Gbit (2Gx8bit) NAND Flash
Parameter
Valid Block
Number
Symbol
Min
Typ
Max
NVB
16064
-
16384
Table 6 : Valid Blocks Numbers
NOTE:
1. The 1st block is guaranteed to be a valid block at the time of shipment.
2. The number of valid blocks is for single plane & multi-plane operations.
3. Each chip has maximum 80 invalid blocks.
Unit
Blocks
Symbol
T_A
T_BIAS
T_STG
VIO⁽²⁾
Vcc
Parameter
Ambient Operating Temperature (Commercial Temperature Range)
Ambient Operating Temperature (Industrial Temperature Range)
Temperature Under Bias
Storage Temperature
Input or Output Voltage
Supply Voltage
Value
0 to 70
-40 to 85
-50 to 125
-65 to 150
-0.6 to 4.6
-0.6 to 4.6
Unit
℃
℃
℃
V
V
V
Table 7: Absolute maximum ratings
NOTE:
1. Except for the rating “Operating Temperature Range”, stresses above those listed in the Table “Absolute
Maximum Ratings” may cause permanent damage to the device. These are stress ratings only and operation of
the device at these or any other conditions above those indicated in the Operating sections of this specification is
not implied. Exposure to Absolute Maximum Rating conditions for extended periods may affect device reliability.
Refer also to the Hynix SURE Program and other relevant quality documents.
2. Minimum Voltage may undershoot to -2V during transition and for less than 20ns during transitions.
Rev 0.2 / Jan. 2008
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