HCPL-3120 Datasheet, PDF (7/15 Pages) Agilent(Hewlett-Packard) – 2.0 Amp Output Current IGBT Gate Drive Optocoupler

Notes:
1. Derate linearly above 70°C free-air
temperature at a rate of 0.3 mA/°C.
2. Maximum pulse width = 10 µs,
maximum duty cycle = 0.2%. This
value is intended to allow for
component tolerances for designs
with I_O peak minimum = 2.0 A. See
Applications section for additional
details on limiting I_OH peak.
3. Derate linearly above 70°C free-air
temperature at a rate of 4.8 mW/°C.
4. Derate linearly above 70°C free-air
temperature at a rate of 5.4 mW/°C.
The maximum LED junction tempera-
ture should not exceed 125°C.
5. Maximum pulse width = 50 µs,
maximum duty cycle = 0.5%.
6. In this test V_OH is measured with a dc
load current. When driving capacitive
loads V_OH will approach V_CC as I_OH
approaches zero amps.
7. Maximum pulse width = 1 ms,
maximum duty cycle = 20%.
8. In accordance with UL1577, each
optocoupler is proof tested by
applying an insulation test voltage
≥ 3000 Vrms for 1 second (leakage
detection current limit, I_I-O ≤ 5 µA).
This test is performed before the
100% production test for partial
discharge (method b) shown in the
VDE 0884 Insulation Characteristic
Table, if applicable.
9. Device considered a two-terminal
device: pins 1, 2, 3, and 4 shorted
together and pins 5, 6, 7, and 8
shorted together.
10. The difference between t_PHL and t_PLH
between any two HCPL-3120 parts
under the same test condition.
11. Pins 1 and 4 need to be connected to
LED common.
12. Common mode transient immunity in
the high state is the maximum
tolerable dV_CM/dt of the common
mode pulse, V_CM, to assure that the
output will remain in the high state
(i.e., V_O > 15.0 V).
13. Common mode transient immunity in
a low state is the maximum tolerable
dV_CM/dt of the common mode pulse,
V_CM, to assure that the output will
remain in a low state (i.e., V_O < 1.0 V).
14. This load condition approximates the
gate load of a 1200V/75A IGBT.
15. Pulse Width Distortion (PWD) is
defined as |t_PHL-t_PLH| for any given
device.
0
I_F = 7 to 16 mA
I_OUT = -100 mA
V_CC = 15 to 30 V
-1
V_EE = 0 V
-2
-3
-4
-40 -20 0 20 40 60 80 100
T_A – TEMPERATURE – °C
2.0
I_F = 7 to 16 mA
V_OUT = (V_CC - 4 V)
1.8
V_CC = 15 to 30 V
V_EE = 0 V
1.6
1.4
1.2
1.0
-40 -20 0 20 40 60 80 100
T_A – TEMPERATURE – °C
-1
100 °C
-2
25 °C
-40 °C
-3
-4
I_F = 7 to 16 mA
-5 V_CC = 15 to 30 V
V_EE = 0 V
-6
0 0.5 1.0 1.5 2.0 2.5
I_OH – OUTPUT HIGH CURRENT – A
Figure 1. V_OH vs. Temperature.
Figure 2. I_OH vs. Temperature.
Figure 3. V_OH vs. I_OH.
0.25
0.20
0.15
V_F(OFF) = -3.0 to 0.8 V
I_OUT = 100 mA
V_CC = 15 to 30 V
V_EE = 0 V
0.10
0.05
0
-40 -20 0 20 40 60 80 100
T_A – TEMPERATURE – °C
4
V_F(OFF) = -3.0 to 0.8 V
V_OUT = 2.5 V
V_CC = 15 to 30 V
3
V_EE = 0 V
2
1
0
-40 -20 0 20 40 60 80 100
T_A – TEMPERATURE – °C
4
V_F(OFF) = -3.0 to 0.8 V
V_CC = 15 to 30 V
V_EE = 0 V
3
2
1
100 °C
25 °C
-40 °C
0
0 0.5 1.0 1.5 2.0 2.5
I_OL – OUTPUT LOW CURRENT – A
Figure 4. V_OL vs. Temperature.
Figure 5. I_OL vs. Temperature.
Figure 6. V_OL vs. I_OL.
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