MC9S08LL64_10 Datasheet, PDF (40/44 Pages) Freescale Semiconductor, Inc – Technical Data

EMC Performance
Table 21. Flash Characteristics (continued)
No.
C
Characteristic
Symbol
Min
Typical
Max
Unit
10
D Page erase current³
Program/erase endurance⁴
11
C
T_L to T_H = –40°C to 85°C
T = 25°C
R_IDDPE
—
6
—
—
10,000
—
—
100,000
—
mA
cycles
12
C Data retention⁵
t_{D_ret}
15
100
—
years
1 _{The frequency of this clock is controlled by a software setting.}
2 _{These values are hardware state machine controlled. User code does not need to count cycles. This information supplied for}
calculating approximate time to program and erase.
3 _{The program and erase currents are additional to the standard run IDD. These values are measured at room temperatures with}
V_DD = 3.0 V, bus frequency = 4.0 MHz.
4 _{Typical endurance for Flash was evaluated for this product family on the 9S12Dx64. For additional information on how}
Freescale defines typical endurance, please refer to Engineering Bulletin EB619, Typical Endurance for Nonvolatile Memory.
5 _{Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated to}
25 °C using the Arrhenius equation. For additional information on how Freescale defines typical data retention, please refer to
Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
3.16 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
3.16.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East).
4 Ordering Information
This appendix contains ordering information for the device numbering system MC9S08LL64 and
MC9S08LL36 devices. See Table 1 for feature summary by package information.
MC9S08LL64 Series MCU Data Sheet, Rev. 5
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Freescale Semiconductor