MC9S08LG32_09 Datasheet, PDF (24/50 Pages) Freescale Semiconductor, Inc – 8-bit HCS08 Central Processor Unit (CPU)

Electrical Characteristics
EXTAL
XOSC
XTAL
Crystal or Resonator
Figure 16. Typical Crystal or Resonator Circuit: Low Range/Low Power
2.9 Internal Clock Source (ICS) Characteristics
Table 11. ICS Frequency Specifications (Temperature Range = –40 °C to 105 °C Ambient)
Num C
Characteristic
Symbol
Min
Typ¹
Max Unit
1
P Average internal reference frequency — factory trimmed
f_{int_ft}
at VDD = 5.0 V and temperature = 25 °C
—
32.768
—
kHz
2 C Average internal reference frequency — user trimmed
f_{int_t}
31.25
3 C Internal reference start-up time
t_IRST
—
4
P DCO output frequency range — Low range (DRS = 00)
f_{dco_t}
16
trimmed²
P
Mid range (DRS = 01)
32
5
P DCO output frequency²
P
Reference = 32768 Hz
and
DMX32 = 1
Low range (DRS = 00) f_{dco_DMX32}
—
Mid range (DRS = 01)
—
—
60
—
—
19.92
39.85
39.0625 kHz
100
μs
20 MHz
40
—
MHz
—
6
C Resolution of trimmed DCO output frequency at fixed
Δf_{dco_res_t}
—
voltage and temperature (using FTRIM)³
±0.1
±0.2 %f_dco
7
C Resolution of trimmed DCO output frequency at fixed
Δf_{dco_res_t}
—
voltage and temperature (not using FTRIM)³
±0.2
±0.4 %f_dco
8 C Total deviation of trimmed DCO output frequency over
Δf_{dco_t}
—
–1.0
±2
%f_dco
voltage and temperature³
to +0.5
9 C Total deviation of trimmed DCO output frequency over
Δf_{dco_t}
—
fixed voltage and temperature range of 0 °C to 70 °C³
±0.5
±1
%f_dco
10 C FLL acquisition time^{3, 4}
t_Acquire
—
—
1
mS
11 C Long term jitter of DCO output clock (averaged over 2 ms C_Jitter
—
interval)⁵
0.02
0.2 %f_dco
1 _{Data in Typical column was characterized at 5.0 V, 25 °C or is typical recommended value.}
2 _{The resulting bus clock frequency should not exceed the maximum specified bus clock frequency of the device.}
3 _{This parameter is characterized and not tested on each device.}
4 _{This specification applies to any time the FLL reference source or reference divider is changed, trim value changed or changing}
from FLL disabled (FBELP, FBILP) to FLL enabled (FEI, FEE, FBE, FBI). If a crystal/resonator is being used as the reference,
this specification assumes it is already running.
5 _{Jitter is the average deviation from the programmed frequency measured over the specified interval at maximum fBus.}
Measurements are made with the device powered by filtered supplies and clocked by a stable external clock signal. Noise
injected into the FLL circuitry via V_DD and V_SS and variation in the crystal oscillator frequency increase the C_Jitter percentage
for a given interval.
MC9S08LG32 Series Data Sheet, Rev. 7
24
Freescale Semiconductor