FAN3216_12 Datasheet, PDF (5/18 Pages) Fairchild Semiconductor – Dual-2A, High-Speed, Low-Side Gate Drivers

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
V_DD
VIN
VOUT
T_L
T_J
TSTG
VDD to PGND
INA and INB to GND
OUTA and OUTB to GND
Lead Soldering Temperature (10 Seconds)
Junction Temperature
Storage Temperature
ESD Human Body Model, JEDEC JESD22-A114
Min.
Max. Unit
-0.3
20.0
V
GND - 0.3 VDD + 0.3 V
GND - 0.3 VDD + 0.3 V
+260
ºC
-55
+150
ºC
-65
+150
ºC
3
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
V_DD Supply Voltage Range
VIN Input Voltage INA and INB
T_A
Operating Ambient Temperature
Min.
4.5
0
-40
Max.
18.0
VDD
+125
Unit
V
V
ºC
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
5
www.fairchildsemi.com