FOD8001R2 Datasheet, PDF (4/12 Pages) Fairchild Semiconductor – High Noise Immunity, 3.3V/5V Logic Gate Optocoupler

Switching Characteristics (Apply over all recommended conditions, typical value is measured at
V_DD1 = V_DD2 = +3.3V, V_DD1 = +3.3V and V_DD2 = +5.0V, V_DD1 = +5.0V and V_DD2 = +3.3V, V_DD1 = V_DD2 = +5.0V, T_A = 25°C)
Symbol Parameter
Test Conditions
Min. Typ. Max. Unit
t_PHL Propagation Delay Time to
Logic Low Output
C_L = 15pF
25
40
ns
t_PLH Propagation Delay Time to
Logic High Output
C_L = 15pF
25
40
ns
PWD
t_PSK
t_R
t_F
|CM_H|
|CM_L|
C_PDI
Pulse Width Distortion,
| t_PHL – t_PLH |
Data Rate
Propagation Delay Skew
Output Rise Time (10%–90%)
Output Fall Time (90%–10%)
Common Mode Transient
Immunity at Output High
Common Mode Transient
Immunity at Output Low
Input Dynamic Power
Dissipation Capacitance⁽⁹⁾
PWD = 40ns, C_L = 15pF
C_L = 15pF⁽⁷⁾
V_I = V_DD1, V_O > 0.8 V_DD1,
V_CM = 1000V⁽⁸⁾
V_I = 0V, V_O < 0.8V,
V_CM = 1000V⁽⁸⁾
2
6
ns
25
Mb/s
20
ns
6.5
ns
6.5
ns
20
40
kV/µs
20
40
kV/µs
30
pF
C_PDO Output Dynamic Power
Dissipation Capacitance⁽⁹⁾
3
pF
Notes:
7. t_PSK is equal to the magnitude of the worst case difference in t_PHL and/or t_PLH that will be seen between units at any
given temperature within the recommended operating conditions.
8. Common mode transient immunity at output high is the maximum tolerable positive dVcm/dt on the leading edge of
the common mode impulse signal, Vcm, to assure that the output will remain high. Common mode transient immunity
at output low is the maximum tolerable negative dVcm/dt on the trailing edge of the common pulse signal, Vcm, to
assure that the output will remain low.
9. Unloaded dynamic power dissipation is calculated as follows:
C_PD x V_DD x f + I_DD + V_PD where f is switched time in MHz.
©2008 Fairchild Semiconductor Corporation
FOD8001 Rev. 1.0.3
4
www.fairchildsemi.com