FOD8001R2 Datasheet, PDF (2/12 Pages) Fairchild Semiconductor – High Noise Immunity, 3.3V/5V Logic Gate Optocoupler

Pin Definitions
Pin Number
1
2
3
4
5
6
7
8
Pin Name
V_DD1
V_I
GND1
GND2
V_O
NC
V_DD2
Pin Function Description
Input Supply Voltage
Input Data
LED Anode – Must be left unconnected
Input Ground
Output Ground
Output Data
Not Connected
Output Supply Voltage
Absolute Maximum Ratings (T_A = 25°C Unless otherwise specified.)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
T_STG
T_OPR
T_SOL
V_DD1, V_DD2
V_I
I_I
V_O
I_O
PD_I
PD_O
Parameter
Storage Temperature
Operating Temperature
Lead Solder Temperature
(Refer to Reflow Temperature Profile)
Supply Voltage
Input Voltage
Input DC Current
Output Voltage
Average Output Current
Input Power Dissipation⁽¹⁾⁽³⁾
Total Power Dissipation⁽²⁾⁽³⁾
Value
-40 to +125
-40 to +105
260 for 10 sec
0 to 6.0
-0.5 to V_DD1 + 0.5
-10 to +10
-0.5 to V_DD2 + 0.5
10
90
70
Units
°C
°C
°C
V
V
µA
V
mA
mW
mW
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
T_A
V_DD1, V_DD2
V_IH
V_IL
t_r, t_f
Parameter
Ambient Operating Temperature
Supply Voltages (3.3V Operation)⁽⁴⁾
Supply Voltages (5.0V Operation)⁽⁴⁾
Logic High Input Voltage
Logic Low Input Voltage
Input Signal Rise and Fall Time
Min.
-40
3.0
4.5
2.0
0
Max.
+105
3.6
5.5
V_DD
0.8
1.0
Unit
°C
V
V
V
ms
Notes:
1. Derate linearly from 25°C at a rate of tbd W/°C
2. Derate linearly from 25°C at a rate of tbd mW/°C.
3. Functional operation under these conditions is not implied. Permanent damage may occur if the device is subjected
to conditions outside these ratings.
4. 0.1µF bypass capacitor must be connected between Pin 1 and 4, and 5 and 8.
©2008 Fairchild Semiconductor Corporation
FOD8001 Rev. 1.0.3
2
www.fairchildsemi.com