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74ABT374_07 Datasheet, PDF (4/13 Pages) Fairchild Semiconductor – Octal D-Type Flip-Flop with 3-STATE Outputs
DC Electrical Characteristics
Symbol
Parameter
VIH Input HIGH Voltage
VIL Input LOW Voltage
VCD Input Clamp Diode Voltage
VOH Output HIGH Voltage
VOL Output LOW Voltage
IIH Input HIGH Current
IBVI Input HIGH Current Breakdown
Test
IIL Input LOW Current
VID Input Leakage Test
VCC
Min.
Min.
Min.
Max.
Max.
Conditions
Recognized HIGH Signal
Recognized LOW Signal
IIN = –18mA
IOH = –3mA
IOH = –32mA
IOL = 64mA
VIN = 2.7V(4)
VIN = VCC
VIN = 7.0V
Max.
0.0
VIN = 0.5V(4)
VIN = 0.0V
IID = 1.9µA, All Other Pins
Grounded
I OZH
I OZL
IOS
I CEX
I ZZ
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Output HIGH Leakage Current
Bus Drainage Test
0–5.5V VOUT = 2.7V, OE = 2.0V
0–5.5V VOUT = 0.5V, OE = 2.0V
Max. VOUT = 0.0V
Max. VOUT = VCC
0.0 VOUT = 5.5V, All Others VCC or
GND
ICCH
I CCL
I CCZ
Power Supply Current
Power Supply Current
Power Supply Current
Max.
Max.
Max.
All Outputs HIGH
All Outputs LOW
OE = VCC, All Others at VCC
or GND
ICCT Additional Outputs Enabled
ICC/Input Outputs 3-STATE
Outputs 3-STATE
ICCD Dynamic ICC No Load(4)
Max.
Max.
VI = VCC – 2.1V
Enable Input VI = VCC – 2.1V
Data Input VI = VCC – 2.1V,
All Others at VCC or GND
Outputs OPEN, OE = GND(3),
One-Bit Toggling,
50% Duty Cycle
Min.
2.0
2.5
2.0
4.75
–100
Notes:
3. For 8-bit toggling, ICCD < 0.8mA/MHz.
4. Guaranteed, but not tested.
Typ.
Max. Units
V
0.8
V
–1.2 V
V
0.55 V
1
µA
1
7
µA
–1
µA
–1
V
10
µA
–10 µA
–275 mA
50
µA
100 µA
50
µA
30 mA
50
µA
2.5 mA
2.5 mA
2.5 mA
0.30 mA/
MHz
©1992 Fairchild Semiconductor Corporation
74ABT374 Rev. 1.4
4
www.fairchildsemi.com