ES29LV320D Datasheet, PDF (37/59 Pages) Excel Semiconductor Inc. – 32Mbit(4M x 8/2M x 16) CMOS 3.0 Volt-only, Boot Sector Flash Memory

EE SS II
Excel Semiconductor inc.
Device
Under
Test
3.3V
2.7kΩ
C_L
6.2kΩ
Figure 16. Test Setup
Note: Diodes are IN3064 or equivalent
Table 12. Test Specifications
Test Condition
Output Load
Output Load Capacitance, C_L (including jig
capacitance)
Input Rise and Fall Times
Input Pulse Levels
Input timing measurement reference levels
Output timing measurement reference levels
80R
30 pF
90
120
1TTL gate
30 pF 100 pF
5 ns
0.0 - 3.0 V
1.5 V
1.5 V
Key To Switching Waveforms
WAVEFORM
INPUTS
Steady
OUTPUTS
Changing from H to L
Changing from L to H
Don’t Care, Any Change Permitted Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
3.0V
0.0V
Input 1.5V
Measurement Level
Figure 17. Input Waveforms and Measurement Levels
1.5V Output
ES29LV320D
37
Rev. 2D Jan 5, 2006