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DS12B887 Datasheet, PDF (12/16 Pages) Dallas Semiconductor – Real Time Clock
DS12B887
AC ELECTRICAL CHARACTERISTICS
PARAMETER
SYMBOL MIN
Cycle Time
tCYC
385
Pulse Width, DS/E Low or RD/WR PWEL
150
High
Pulse Width, DS/E High or RD/WR PWEH
125
Low
Input Rise and Fall Time
tR,tF
Chip Select Setup Time Before DS,
tCS
20
WR, or RD
Chip Select Hold Time
tCH
0
Read Data Hold Time
tDHR
10
Write Data Hold Time
tDHW
0
Muxed Address Valid Time to AS/ tASL
30
ALE Fall
Muxed Address Hold Time
tAHL
10
Delay Time DS/E to AS/ALE Rise
tASD
20
Pulse Width AS/ALE High
PWASH
60
Delay Time, AS/ALE to DS/E Rise tASED
40
Output Data Delay Time From tDDR
20
DS/E or RD
Data Setup Time
IRQ Release from DS
tDSW
100
tIRDS
(0°C to 70°C; VCC = 4.5V to 5.5V)
TYP
MAX
UNITS NOTES
DC
ns
ns
ns
30
ns
ns
ns
80
ns
ns
ns
ns
ns
ns
ns
120
ns
5
ns
2
ms
NOTES:
1. All voltages are referenced to ground.
2. All outputs are open.
3. Applies to the AD0-AD7 pins, the IRQ pin,and the SQW pin when each is in the high impedance state.
4. The IRQ pin is open drain.
5. Measured with a load of 50 pf + 1 TTL gate.
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