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W48S101-04 Datasheet, PDF (8/12 Pages) Cypress Semiconductor – Spread Spectrum Motherboard Frequency Generator
PRELIMINARY
W48S101-04
Absolute Maximum Ratings
Stresses greater than those listed in this table may cause per-
manent damage to the device. These represent a stress rating
only. Operation of the device at these or any other conditions
above those specified in the operating sections of this specifi-
cation is not implied. Maximum conditions for extended peri-
ods may affect reliability.
Parameter
VDD, VIN
TSTG
TA
TB
ESDPROT
Description
Voltage on any pin with respect to GND
Storage Temperature
Operating Temperature
Ambient Temperature under Bias
Input ESD Protection
Rating
Unit
–0.5 to +7.0
V
–65 to +150
°C
0 to +70
°C
–55 to +125
°C
2 (min.)
kV
DC Electrical Characteristics: TA = 0°C to +70°C, VDDQ3 = 3.3V±5%, VDDQ2 = 2.5V±5%
Parameter
Description
Test Condition
Min.
Typ.
Supply Current
IDDQ3
3.3V Supply Current
CPUCLK =100 MHz
Outputs Loaded[3]
IDDQ3
2.5V Supply Current
Logic Inputs
VIL
Input Low Voltage
GND –
0.3
VIH
Input High Voltage
2.0
IIL
Input Low Current[4]
IIH
Input High Current[4]
IIL
Input Low Current (SEL100/66#)
IIH
Input High Current (SEL100/66#)
Clock Outputs
VOL
Output Low Voltage
IOL = 1 mA
VOH
Output High Voltage
IOH = –1 mA
3.1
VOH
Output High Voltage (CPU, APIC)
IOH = –1 mA
2.2
IOL
Output Low Current CPU0:3
VOL = 1.25V
27
57
PCI_F, PCI1:7 VOL = 1.5V
20.5
53
APIC0:1
VOL = 1.25V
40
85
REF0:2
VOL = 1.5V
25
37
48MHz 0:1
VOL = 1.5V
25
37
IOH
Output High Current CPU0:3
VOL = 1.25V
25
55
PCI_F, PCI1:7 VOL = 1.5V
31
55
APIC0:1
VOL = 1.25V
40
87
REF0:2
VOL = 1.5V
27
44
48MHz 0:1
VOL = 1.5V
27
44
Notes:
3. All clock outputs loaded with maximum lump capacitance test load specified in the AC Electrical Characteristics section.
4. W48S101-04 logic inputs have internal pull-up devices, except SEL100/66#.
Max.
Unit
120
mA
60
mA
0.8
V
VDD +
V
0.3
–25
µA
10
µA
–5
µA
5
µA
50
mV
V
V
97
mA
139
mA
140
mA
76
mA
76
mA
97
mA
189
mA
155
mA
94
mA
94
mA
8