PAL20V8 Datasheet, PDF (4/13 Pages) Cypress Semiconductor – Flash Erasable, Reprogrammable CMOS PAL Device

PALCE20V8
Electrical Characteristics Over the Operating Range^[2]
Parameter
Description
Test Conditions
V_OH
V_OL
V_IH
V_IL[4]
I_IH
I_IL[5]
I_SC
I_CC
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
V_CC = Min.,
V_IN = V_IH or V_IL
I_OH = −3.2 mA
I_OH = −2 mA
Com’l
Mil/Ind
V_CC = Min.,
V_IN = V_IH or V_IL
I_OL = 24 mA
I_OL = 12 mA
Com’l
Mil/Ind
Guaranteed Input Logical HIGH Voltage for All Inputs^[3]
Guaranteed Input Logical LOW Voltage for All Inputs^[3]
Input or I/O HIGH Leakage 3.5V < V_IN < V_CC
Current
Input or I/O LOW Leakage
Current
Output Short Circuit Current
Operating Power Supply
Current
0V < V_IN < V_IN (Max.)
V_CC = Max., V_OUT = 0.5V^[6,7]
V_CC = Max.,
V_IL = 0V, V_IH = 3V,
Output Open,
f = 15 MHz
(counter)
5, 7, 10 ns
15, 25 ns
15L, 25L ns
10, 15, 25 ns
Com’l
Mil/Ind
15L, 25L ns
Mil/Ind
Min.
2.4
2.0
−0.5
−30
Max. Unit
V
0.5 V
V
0.8 V
10 µA
−100 µA
−150 mA
115 mA
90 mA
55 mA
130 mA
65 mA
Capacitance^[7]
Parameter
C_IN
C_OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
V_IN = 2.0V @ f = 1 MHz
V_OUT = 2.0V @ f = 1 MHz
Typ.
Unit
5
pF
5
pF
Endurance Characteristics^[7]
Parameter
Description
Test Conditions
Min. Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions 100
Cycles
Notes:
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V_IL (Min.) is equal to −3.0V for pulse durations less than 20 ns.
5. The leakage current is due to the internal pull-up resistor on all pins.
6. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V_OUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
7. Tested initially and after any design or process changes that may affect these parameters.
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