CG5982AF Datasheet, PDF (3/12 Pages) Cypress Semiconductor – 2K x 8 Automotive Dual-port Static RAM

CG5982AF
Electrical Characteristics Over the Operating Range^[4] (continued)
Parameter
Description
I_CC
V_CC Operating Supply Current
I_SB1
Standby Current Both Ports,
TTL Inputs
I_SB2
Standby Current One Port,
TTL Inputs
I_SB3
Standby Current Both Ports,
CMOS Inputs
I_SB4
Standby Current One Port,
CMOS Inputs
Capacitance^[8]
Test Conditions
Cf _=Ef=MAV_XIL[7,_] Outputs Open,
Cf _=ELfMa_An_Xd_[7C_] E_R > V_IH,
OCEut^LpourtsCOE^Rpe>nV, ^If^H=, ^Af_M^ct_A^iv_X^{e[7P] ort}
Both Ports CE_L and CE_R >
V_CC – 0.2V, V_IN > V_CC – 0.2V
or V_IN < 0.2V, f = 0
One Port CE_L or CE_R > V_CC
– 0.2V, V_IN > V_CC – 0.2V or
V_IN < 0.2V, Active
Outputs Open, f =
Port
f_MAX[7]
Auto
Auto
Auto
Auto
Auto
CG5982AF
Min.
Max.
120
45
90
15
85
Unit
mA
mA
mA
mA
mA
Parameter
C_IN
C_OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T_A = 25°C, f = 1 MHz,
V_CC = 5.0V
Max.
Unit
15
pF
10
pF
AC Test Loads and Waveforms
5V
OUTPUT
R1 893Ω
30 pF
Including
Jig and
Scope
(a)
R2
347Ω
5V
OUTPUT
R1 893Ω
5 pF
Including
Jig and
Scope
(b)
R2
347Ω
Equivalent to:
THÉVENIN EQUIVALENT
250Ω
OUTPUT
1.4V
3.0V
GND
10%
< 5 ns
5V
BUSY
OR
INT
281Ω
30 pF
BUSY Output Load
(CY7C132/CY7C136 Only)
All input pulses
90%
90%
10%
< 5 ns
Switching Characteristics Over the Operating Range^{[4, 9]}
CG5982AF
Parameter
Description
Min. Max. Unit
Read Cycle
t_RC
Read Cycle Time
t_AA
Address to Data Valid^[10]
55
ns
55
ns
t_OHA
t_ACE
t_DOE
t_LZOE
Data Hold from Address Change
CE LOW to Data Valid^[10]
OE LOW to Data Valid^[10]
OE LOW to Low-Z^{[8, 11]}
0
ns
55
ns
25
ns
3
ns
Notes:
7. At f = f_MAX, address and data inputs are cycling at the maximum frequency of read cycle of 1/t_rc and using AC Test Waveforms input levels of GND to 3V.
8. This parameter is guaranteed but not tested.
9. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V, output loading of the specified
I_OL/I_OH, and 30-pF load capacitance.
10. AC test conditions use V_OH = 1.6V and V_OL = 1.4V.
11. At any given temperature and voltage condition for any given device, t_HZCE is less than t_LZCE and t_HZOE is less than t_LZOE.
Document #: 38-06067 Rev. *C
Page 3 of 12
[+] Feedback