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W312-02 Datasheet, PDF (17/21 Pages) Cypress Semiconductor – FTG for VIA K7 Series Chipset with Programmable Output Frequency
W312-02
DC Electrical Characteristics: TA = 0°C to +70°C, VDD = 3.3V±5% and 2.5V±5% (continued)
Parameter
Description
Test Condition
Min.
Typ.
Max.
Unit
Crystal Oscillator
VTH
X1 Input Threshold Voltage[4]
CLOAD
Load Capacitance, Imposed on
External Crystal[5]
CIN,X1
X1 Input Capacitance[6]
Pin Capacitance/Inductance
VDD = 3.3V
Pin X2 unconnected
1.65
V
18
pF
TBD
pF
CIN
COUT
LIN
Input Pin Capacitance
Output Pin Capacitance
Input Pin Inductance
Except X1 and X2
5
pF
6
pF
7
nH
AC Electrical Characteristics
TA = 0°C to +70°C, VDDQ3 = 3.3V±5%, fXTL = 14.31818 MHz
AC clock parameters are tested and guaranteed over stated operating conditions using the stated lump capacitive load at the
clock output; Spread Spectrum is disabled.
CPU Clock Outputs (CPUT0, CPUC0, CPU_CS)[7]
Parameter
Description
Test Condition/Comments
tR
Output Rise Edge Rate CPU_CS
tF
Output Fall Edge Rate CPU_CS
tD
Duty Cycle
Measured at 50% point
tJC
Jitter, Cycle to Cycle
fST
Frequency Stabilization Assumes full supply voltage reached
from Power-up (cold within 1 ms from power-up. Short
start)
cycles exist prior to frequency
stabilization.
Zo
AC Output Impedance VO = VX
CPU = 100 MHz
Min. Typ. Max.
1.0
4.0
1.0
4.0
45
55
250
3
50
CPU = 133 MHz
Min. Typ. Max. Unit
1.0
4.0 V/ns
1.0
4.0 V/ns
45
55 %
250 ps
3
ms
50
Ω
Notes:
5. The W312-02 contains an internal crystal load capacitor between pin X1 and ground and another between pin X2 and ground. Total load placed on crystal is
18 pF; this includes typical stray capacitance of short PCB traces to crystal.
6. X1 input capacitance is applicable when driving X1 with an external clock source (X2 is left unconnected).
7. Refer to Figure 1 for K7 operation clock driver test circuit.
Document #: 38-07259 Rev. *B
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