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CAT28F102 Datasheet, PDF (5/14 Pages) Catalyst Semiconductor – 1 Megabit CMOS Flash Memory
CAT28F102
A.C. CHARACTERISTICS, Read Operation
VCC = +5V ±10%, unless otherwise specified
JEDEC Standard
28F102-45(7) 28F102-55(7) 28F102-70 (7) 28F102- 90 (8)
Vcc=5V+5%
Vcc=5V+5%
Symbol Symbol Parameter
Min. Max. Min. Max. Min. Max. Min. Max Unit
tAVAV
tRC
Read Cycle Time
45
tELQV
tCE
CE Access Time
tAVQV
tACC
Address Access Time
tGLQV
tOE
OE Access Time
tAXQX
tOH
Output Hold from Address
0
OE/CE Chan
tGLQX
tOLZ(1)(6) OE to Output in Low-Z
0
tELQX
tLZ(1)(6) CE to Output in Low-Z
0
tGHQZ
tDF(1)(2) OE High to Output High-Z
tEHQZ(1)(2)
-
CE High to Output High-Z
tWHGL
Write Recovery Time Before 6
Read
55
70
90
ns
45
55
70
90 ns
45
55
70
90 ns
20
25
28
35 ns
0
0
0
ns
0
0
0
ns
0
0
0
ns
15
15
18
20 ns
15
15
25
30 ns
6
6
6
µs
Figure 1. A.C. Testing Input/Output Waveform(3)(4)(5)
2.4 V
2.0 V
INPUT PULSE LEVELS
0.45 V
0.8 V
REFERENCE POINTS
Figure 2. A.C. Testing Load Circuit (example) 1.3V
5108 FHD F03
1N914
3.3K
DEVICE
UNDER
TEST
OUT
CL = 100 pF
CL INCLUDES JIG CAPACITANCE
Figure 3. High Speed A.C. Testing Input/Output Waveform(3)(4)(5)
23.4V V
0.04.50 V
INPUT PULSE LEVELS
2.0 V
1.5V
0.8 V
REFERENCE POINTS
Figure 4. High Speed A.C. Testing Load Circuit (example)
1.3V
1N914
5108 FHD F04
3.3K
DEVICE
UNDER
TEST
OUT
CL = 1300 pF
Note:
CL INCLUDES JIG CAPACITANCE
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For high speed input pulse levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For high speed input and output timing reference=1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7) For Load and Reference Points see Figures 3 and 4
(8) For Load and Reference Points see Figures 1 and 2
5
Doc. No. 25038-0A 2/98 F-1