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CAT34C02 Datasheet, PDF (2/17 Pages) Catalyst Semiconductor – 2-Kb I2C EEPROM for DDR2 DIMM Serial Presence Detect
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CAT34C02
ABSOLUTE MAXIMUM RATINGS*
Storage Temperature
Voltage on Any Pin with Respect to Ground(1)
-65°C to +150°C
-0.5 V to +6.5 V
* Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions outside of those listed in the operational sections of this specification
is not implied. Exposure to any absolute maximum rating for extended periods may affect device performance and reliability.
RELIABILITY CHARACTERISTICS(2)
Symbol Parameter
NEND(*) Endurance
TDR Data Retention
(*) Page Mode, VCC = 5 V, 25°C
Min
1,000,000
100
Units
Program/ Erase Cycles
Years
D.C. OPERATING CHARACTERISTICS
VCC = 1.7 V to 5.5 V, TA = -40°C to 85°C, unless otherwise specified.
Symbol Parameter
Test Conditions
ICC
ISB
IL
VIL
VIH
VOL1
VOL2
VHV(1)
Supply Current
Standby Current
I/O Pin Leakage
Input Low Voltage
Input High Voltage
Output Low Voltage
Output Low Voltage
RSWP Set/Clear A0 High Voltage
Read or Write at 400 kHz
All I/O Pins at GND or VCC
Pin at GND or VCC
VCC > 2.5 V, IOL = 3.0 mA
VCC > 1.7 V, IOL = 1.0 mA
1.7 V < VCC < 3.6 V
Min
Max
1
1
1
-0.5 VCC x 0.3
VCC x 0.7 VCC + 0.5
0.4
0.2
VCC + 4.8
10
Units
mA
μA
μA
V
V
V
V
V
PIN IMPEDANCE CHARACTERISTICS
TA = 25°C, f = 400 kHz, VCC = 5 V
Symbol Parameter
Conditions
Min
Max
Units
CIN(2)
CIN(2)
SDA I/O Pin Capacitance
Input Capacitance (other pins)
VIN = 0 V
VIN = 0 V
8
pF
6
pF
ZWPL WP Input Low Impedance
VIN < 0.5 V
5
70
kΩ
ILWPH WP Input High Leakage
VIN > VCC x 0.7
1
μA
Note:
(1) The DC input voltage on any pin should not be lower than -0.5 V or higher than VCC + 0.5 V. During transitions, the voltage on any pin may
undershoot to no less than -1.5 V or overshoot to no more than VCC + 1.5 V, for periods of less than 20 ns. The maximum DC voltage on
address pin A0 is +10.0 V at 25°C. A series resistor of ~ 1.5 kΩ should be used when driving pin A0 to VHV, or else, the current compliance
of the VHV driver should be limited to ~ 1 mA.
(2) These parameters are tested initially and after a design or process change that affects the parameter according to appropriate AEC-Q100
and JEDEC test methods.
Doc. No. 1095, Rev. C
2
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
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