UG01 Datasheet, PDF (7/7 Pages) ATMEL Corporation – 0.6um ULC Series

UG Series
– P₁ = 0
– P₂ = 5 * 0.5 * 100 * 33/16/1000 = 0.5 mW
– P₃ = 5² * 16 * 33/16 * (25 + 2)/1000 = 22 mW
– P = 0 + 0.5 + 22 = 22.5 mW
Typical ULC Test Conditions
For AC specification purposes, an improved output
loading scheme has been defined for Atmel Wireless &
Microcontrollers high-drive (24 mA), high-speed ULC
devices. The schematic below (Figure 5.) describes the
typical conditions for testing these ULC devices, using
the standard loading scheme commonly available on
high-end ATE.
Compared to a no-load condition, this provides the
following advantages:
D Output load is more representative of “real life”
conditions during transitions.
D Transient energy is absorbed at the end of the line to
prevent reflections which would lead to inaccurate
ATE measurements.
Figure 5. Typical ULC Test Conditions
12 mA
D.U.T.
1.5 V
12 mA
Comp
Rev. B – 25 May. 98
5–7