PALCE16V8 Datasheet, PDF (14/26 Pages) Advanced Micro Devices – EE CMOS 20-Pin Universal Programmable Array Logic

ABSOLUTE MAXIMUM RATINGS
Storage Temperature . . . . . . . . . . . –65°C to +150°C
Ambient Temperature
with Power Applied . . . . . . . . . . . . . –55°C to +125°C
Supply Voltage with
Respect to Ground . . . . . . . . . . . . –0.5 V to + 7.0 V
DC Input Voltage . . . . . . . . . . . –0.5 V to VCC + 0.5 V
DC Output or I/O
Pin Voltage . . . . . . . . . . . . . . . –0.5 V to VCC + 0.5 V
Static Discharge Voltage . . . . . . . . . . . . . . . . . 2001 V
Latchup Current
(TA = –40°C to +85°C) . . . . . . . . . . . . . . . . . . 100 mA
Stresses above those listed under Absolute Maximum Rat-
ings may cause permanent device failure. Functionality at or
above these limits is not implied. Exposure to Absolute Maxi-
mum Ratings for extended periods may affect device reliabil-
ity. Programming conditions may differ.
AMD
OPERATING RANGES
Commercial (C) Devices
Temperature (TA) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . . . 0°C to +75°C
Supply Voltage (VCC) with
Respect to Ground . . . . . . . . . . . . +4.75 V to +5.25 V
Industrial (I) Devices
Temperature (TA) Operating
in Free Air . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
Supply Voltage (VCC) with
Respect to Ground . . . . . . . . . . . . . . +4.5 V to +5.5 V
Operating ranges define those limits between which the func-
tionality of the device is guaranteed.
DC CHARACTERISTICS over COMMERCIAL and INDUSTRIAL operating ranges
Parameter
Symbol
Parameter Description
Test Conditions
Min Max Unit
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
IOH = –3.2 mA
VCC = Min
VIN = VIH or VIL
IOL = 24 mA
VCC = Min
VIN = VIH or VIL
Guaranteed Input Logical HIGH
Voltage for all Inputs (Note 1)
2.4
V
0.5 V
2.0
V
VIL
Input LOW Voltage
Guaranteed Input Logical LOW
Voltage for all Inputs (Note 1)
0.8 V
IIH
Input HIGH Leakage Current
VIN = 5.25 V, VCC = Max (Note 2)
10 µA
IIL
Input LOW Leakage Current
VIN = 0 V, VCC = Max (Note 2)
–100 µA
IOZH
Off-State Output Leakage
Current HIGH
VOUT = 5.25 V, VCC = Max
VIN = VIH or VIL (Note 2)
10 µA
IOZL
Off-State Output Leakage
Current LOW
VOUT = 0 V, VCC = Max
VIN = VIH or VIL (Note 2)
–100 µA
ISC
Output Short-Circuit Current
VOUT = 0.5 V VCC = Max (Note 3)
–30 –150 mA
ICC
(Dynamic)
Commercial Supply Current
Outputs Open (IOUT = 0 mA)
VCC = Max, f = 15 MHz
115 mA
Industrial Supply Current
130 mA
Notes:
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of IIL and IOZL (or IIH and IOZH).
3. Not more than one output should be shorted at a time and duration of the short-circuit should not exceed one second.
VOUT = 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
PALCE16V8H-10 (Com’l, Ind)
2-49