PC28F512G18FF Datasheet, PDF (61/118 Pages) Micron Technology – 128Mb, 256Mb, 512Mb, 1Gb StrataFlash Memory

128Mb, 256Mb, 512Mb, 1Gb StrataFlash Memory
Electrical Specifications – AC Characteristics and Operating
Conditions
Electrical Specifications – AC Characteristics and Operating Conditions
AC Test Conditions
Figure 16: AC Input/Output Reference Waveform
V_CCQ
Input
0V
V_CCQ/2
Test points
t_RISE/FALL
V_CCQ/2 Output
Note:
1. AC test inputs are driven at V_CCQ for Logic 1, and 0.0V for Logic 0. Input/output timing
begins/ends at V_CCQ/2. Input rise and fall times (10% to 90%) <5ns. Worst-case speed oc-
curs at V_CC = V_CC,min.
Table 37: AC Input Requirements
Parameter
Inputs rise/fall time (Address,
CLK, CE#, OE#, ADV#, WE#, WP#)
Symbol
t_RISE/FALL
Address-address skew¹
t_ASKW
Frequency
@133 MHz,
108 MHz
@66 MHz
Min
0.3
0
0
Max
1.2
3
3
Unit
ns
ns
Condition
V_IL to V_IH or
V_IH to V_IL
@V_CCQ/2
Note: 1. For an address to be latched the skew is defined as the time when the first address bit is
valid to the last address bit going valid.
Figure 17: Transient Equivalent Testing Load Circuit
Device under
test
Out
C_L
Notes:
1. See Test Configuration Load Capacitor Values for Worst Case Speed Conditions table for
component values for the test configurations.
2. C_L includes jig capacitance.
Table 38: Test Configuration Load Capacitor Values for Worst Case Speed
Conditions
Test Configuration
1.7V Standard test
2.0V Standard test
C_L (pF)
30
30
PDF: 09005aef8448483a
128_256_512_65nm_g18.pdf - Rev. F 8/11 EN
61
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