TSI-1 Datasheet, PDF (15/61 Pages) Agere Systems – 1k x 1k Time-Slot Interchanger

Data Sheet, Revision 3
September 21, 2005
TSI-1
1k x 1k Time-Slot Interchanger
3 Operating Conditions and Reliability
3.1 Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can cause permanent damage to the device. These are absolute
stress ratings only. Functional operation of the device is not implied at these or any other conditions in excess of those
given in the operational sections of the data sheet. Exposure to absolute maximum ratings for extended periods can
adversely affect device reliability.
Table 3-1. Absolute Maximum Ratings
Parameter
Supply Voltage (VDD33)
Supply Voltage (VDD15)
Input Voltage:
TXD[15:0]
All Other Inputs
Storage Temperature
Junction Temperature
Min
Max
Unit
–0.5
4.2
V
–0.5
1.8
V
–0.5
5.5
V
–0.3
VDD33 + 0.3
V
–40
125
°C
—
125
°C
3.2 Recommended Operating Conditions
Table 3-2 lists the voltages, along with the tolerances, that are required for proper operation of the device.
Table 3-2. Operating Conditions
Parameter
Supply Voltage (VDD33)
Supply Voltage (VDD15)
Ambient Temperature
Min
Typ
Max
Unit
3.14
3.3
3.47
V
1.4
1.5
1.6
V
–40
—
85
°C
3.3 Handling Precautions
Although electrostatic discharge (ESD) protection circuitry has been designed into this device, proper precautions must be
taken to avoid exposure to ESD and electrical overstress (EOS) during all handling, assembly, and test operations. Agere
employs both a human-body model (HBM) and a charged-device model (CDM) qualification requirement in order to deter-
mine ESD-susceptibility limits and protection design evaluation. ESD voltage thresholds are dependent on the circuit param-
eters used in each of the models, as defined by JEDEC’s JESD22-A114 (HBM) and JESD22-C101 (CDM) standards.
Table 3-3. ESD Tolerance
Device
TSI-1
Voltage
2,000 V
500 V
Type
HBM (human-body model)
CDM (charged-device model)
Agere Systems Inc.
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