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DAC8562 Datasheet, PDF (8/16 Pages) Analog Devices – +5 Volt, Parallel Input Complete 12-Bit DAC
DAC8562–Typical Performance Characteristics
10
VDD = +5V
TA = 25°C
DATA = FFFH
1
0.1
0.01
10
100
1k
10k
FREQUENCY – Hz
100k
Figure 20. Output Voltage Noise
Density vs. Frequency
5
4
VDD = +5V
DATA = FFFH
3
READINGS NORMALIZED
2 TO ZERO HOUR TIME POINT
1
0
–1
RANGE
AVG
–2
–3
–4
135 UNITS TESTED
–5
0
200 400 600 800 1000
HOURS OF OPERATION AT +125°C
1200
Figure 21. Long-Term Drift
Accelerated by Burn-In
8
7
VDATA = +2.4V
NO LOAD
6
5
VDD = +5.0V
4
VDD = +5.25V
3
2
VDD = +4.75V
1
0
–50 –25
0 25 50 75
TEMPERATURE – °C
100 125
Figure 22. Supply Current vs.
Temperature
100
90
VDD
0V
VREF
0V 10
0%
2V
TA = +25°C
RL = ∞
2V
1µs
TIME = 1µs/DIV
Figure 23. Reference Startup vs.
Time
1
100
0 90
A4 0.040 V
DLY
13.82 µs
CE = HIGH
10
0%
5V
5mV
BLw
5µs
TIME = 20µs/DIV
Figure 24. Digital Feedthrough vs.
Time
10
8
6
VDD = +5V
4 SAMPLE SIZE = 300
2
AVG +1σ
X
0
–2
AVG –1σ
–4
–6
–8
–10
–50 –25 0
25 50 75 100 125
TEMPERATURE – °C
Figure 25. Reference Error vs.
Temperature
0.005
0.004
AVG + 3 σ
0.003 AVG
0.002
AVG – 3σ
0.001
VDD = +5V
∆IL = 5mA
SAMPLE SIZE = 302 PCS
0.000
–50 –25 0 25 50 75 100 125
TEMPERATURE – °C
Figure 26. Reference Load
Regulation vs. Temperature
0.10
VDD = +4.75 TO +5.25V
0.08
SAMPLE SIZE = 302 PCS
0.06
AVG + 3σ
AVG
0.04
AVG – 3 σ
0.02
0.00
–50 –25
0 25 50 75 100 125
TEMPERATURE – °C
Figure 27. Reference Line
Regulation vs. Temperature
–8–
REV. A